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2011•Unpublished venueRequires access

Common mode choke investigation for low pass filter application

Jamal Shafii, Harry Chai, Ron Gadow

Open publisher page 2 citations

Abstract

We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.

About this research paper

What this paper is about

We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.

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OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

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Method / approach

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Available abstract

We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.

Key concepts: Choke, EMI, Electromagnetic interference, Filter (signal processing), Common-mode signal, Electronic engineering, Electrical engineering, Low-pass filter

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