1994•Unpublished venueRequires access

Design for testability, reliability and maintainability

Allen Buckroyd

Abstract

To meet the objective of high yield and high reliability the author proposes the combined use of the following techniques: design for functionality, design to cost, design for manufacture, design for testability, design for reliability, design for maintainability, statistical process control, failure reporting and corrective analysis system, failure mode effect and criticality analysis, and concurrent engineering.

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Available abstract

Key concepts: Reliability engineering, Maintainability, Failure mode, effects, and criticality analysis, Testability, Failure mode and effects analysis, Reliability (semiconductor), Engineering, Computer science