Commonly observed degradation in field-aged photovoltaic modules
Michael A. Quintana, D.L. King, T. J. McMahon, C.R. Osterwald
Abstract
Michael A. Quintana, D.L. King, T. J. McMahon, C.R. Osterwald
Abstract
Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.
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Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.
Key concepts: Degradation (telecommunications), Photovoltaic system, Materials science, Intrusion, Computer science, Electronic engineering, Electrical engineering, Engineering