2003Japanese Journal of Applied PhysicsOpen access

Design and Characteristics of Polysilicon Emitter Bipolar Junction Transistors

Neng-Fu Shih

Open full text 1 citations

Abstract

Through the aid of empirical equations, a process simulator and a device simulator, a polysilicon (p-Si) emitter bipolar junction transistor (PEBJT) suitable for mass-production has been designed, fabricated, and characterized. The device with an emitter size of 5 µm × 9 µm has more than 1 order flatness of h FE vs. I C , and has more than 4 orders flatness with an emitter size of 9 µm × 9 µm The ideality factors of the collector current are around 1 for the operating temperature ranging from 24°C to 125°C, with base to emitter applied voltage = 0.4–0.5.

Open-access reader

About this research paper

What this paper is about

Through the aid of empirical equations, a process simulator and a device simulator, a polysilicon (p-Si) emitter bipolar junction transistor (PEBJT) suitable for mass-production has been designed, fabricated, and characterized. The device with an emitter size of 5 µm × 9 µm has more than 1 order flatness of h FE vs. I C , and has more than 4 orders flatness with an emitter size of 9 µm × 9 µm The ideality factors of the collector current are around 1 for the operating temperature ranging from 24°C to 125°C, with base to emitter applied voltage = 0.4–0.5.

Why it matters

OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Through the aid of empirical equations, a process simulator and a device simulator, a polysilicon (p-Si) emitter bipolar junction transistor (PEBJT) suitable for mass-production has been designed, fabricated, and characterized. The device with an emitter size of 5 µm × 9 µm has more than 1 order flatness of h FE vs. I C , and has more than 4 orders flatness with an emitter size of 9 µm × 9 µm The ideality factors of the collector current are around 1 for the operating temperature ranging from 24°C to 125°C, with base to emitter applied voltage = 0.4–0.5.

Key concepts: Common emitter, Bipolar junction transistor, Flatness (cosmology), Heterostructure-emitter bipolar transistor, Materials science, Optoelectronics, Transistor, Voltage

Related papers

Back to paper searchBrowse research topicsOriginal source
Design and Characteristics of Polysilicon Emitter Bipolar Junction Transistors — Research Paper | ScholarLens