Measurement of phase error distributions in silica-basedarrayed-waveguidegrating multiplexers by using Fourier transform spectroscopy
K. Takada, Y. Inoue, Hiroaki Yamada, M. Horiguchi
Abstract
K. Takada, Y. Inoue, Hiroaki Yamada, M. Horiguchi
Abstract
The phase errors caused by deviations in the designed lengths of the optical paths in silica-based arrayed-waveguide grating (AWG) multiplexers were measured using Fourier transform spectroscopy. The measurement accuracy was ±1°. The phase errors in an AWG multiplexer with a channel spacing of 10 GHz and a channel crosstalk of –15 dB were randomly distributed between –122 and 90°.
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The phase errors caused by deviations in the designed lengths of the optical paths in silica-based arrayed-waveguide grating (AWG) multiplexers were measured using Fourier transform spectroscopy. The measurement accuracy was ±1°. The phase errors in an AWG multiplexer with a channel spacing of 10 GHz and a channel crosstalk of –15 dB were randomly distributed between –122 and 90°.
Key concepts: Multiplexer, Arrayed waveguide grating, Optics, Grating, Materials science, Fourier transform, Crosstalk, Fourier transform infrared spectroscopy