2006Unpublished venueRequires access

Evaluating ate-equipment for volume diagnosis

R. Arnold, Andreas Leininger

Open publisher page 8 citations

Abstract

Test data collection is increasingly seen as an important functionality of the ATE. The lack of clear specification parameters makes comparison of different ATE equipment with regard to data collection a difficult job. In this paper, the approach of Infineon Technologies is presented. Evaluation scenarios for measuring the performance of new ATE equipment regarding diagnosis data acquisition during production test are described. Evaluation results of "state-of-the-art" test equipment are compared and the deficiencies of today's test equipment are discussed compared to Infineons requirement "zero run time overhead"

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What this paper is about

Test data collection is increasingly seen as an important functionality of the ATE. The lack of clear specification parameters makes comparison of different ATE equipment with regard to data collection a difficult job. In this paper, the approach of Infineon Technologies is presented. Evaluation scenarios for measuring the performance of new ATE equipment regarding diagnosis data acquisition during production test are described. Evaluation results of "state-of-the-art" test equipment are compared and the deficiencies of today's test equipment are discussed compared to Infineons requirement "zero run time overhead"

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OpenAlex reports 8 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Test data collection is increasingly seen as an important functionality of the ATE. The lack of clear specification parameters makes comparison of different ATE equipment with regard to data collection a difficult job. In this paper, the approach of Infineon Technologies is presented. Evaluation scenarios for measuring the performance of new ATE equipment regarding diagnosis data acquisition during production test are described. Evaluation results of "state-of-the-art" test equipment are compared and the deficiencies of today's test equipment are discussed compared to Infineons requirement "zero run time overhead"

Key concepts: Automatic test equipment, Test equipment, Reliability engineering, Test (biology), Overhead (engineering), Computer science, Volume (thermodynamics), Data collection

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