Field Emission Diode Characterization Through Model Parameters Extraction From Current-voltage Experimental Data
D. Nicolaescu, Andrei Avram
Abstract
D. Nicolaescu, Andrei Avram
Abstract
Standard field emission diode and array modeling is based on the planar Fowler–Nordheim (FN) current density‐electric field J(E) relationship and the introduction of the field enhancement a and area b factors to relate E and J to the measurable quantities potential V and current I. This approach is questionable because E is not constant on the emitter and the b factor is V dependent. In this article, while still using the FN J(E) relationship, I(V) is obtained through J integration over the emitter surface, based on the ideal field emitter floating sphere model (FSM). The model parameters are the emitter’s height h, radius R, work function φ, and anode–cathode planes spacing d and the factors a and b are not used. A parameters extraction procedure (PEP) has been developed, in order to obtain the value of the parameters within the model framework ensuring the best fit to the experimental field emission data. The objective function to be minimized is the standard deviation between FSM and experimental field...
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Standard field emission diode and array modeling is based on the planar Fowler–Nordheim (FN) current density‐electric field J(E) relationship and the introduction of the field enhancement a and area b factors to relate E and J to the measurable quantities potential V and current I. This approach is questionable because E is not constant on the emitter and the b factor is V dependent. In this article, while still using the FN J(E) relationship, I(V) is obtained through J integration over the emitter surface, based on the ideal field emitter floating sphere model (FSM). The model parameters are the emitter’s height h, radius R, work function φ, and anode–cathode planes spacing d and the factors a and b are not used. A parameters extraction procedure (PEP) has been developed, in order to obtain the value of the parameters within the model framework ensuring the best fit to the experimental field emission data. The objective function to be minimized is the standard deviation between FSM and experimental field...
Key concepts: Diode, Characterization (materials science), Voltage, Extraction (chemistry), Optoelectronics, Field (mathematics), Materials science, Current (fluid)