Possible Emittance Increase through Filamentation Due to Space Charge in Continuous Beams
P. Lapostolle
Abstract
Open-access reader
P. Lapostolle
Abstract
Open-access reader
The study of oscillations which can take place in a beam under space charge conditions has been extended to other distributions than the one described by Kapchinsky and Vladimirsky (K. V.) in 1959. Two sets of equations similar to the ones they established can be written provided axis and emittance values are replaced by rms expressions applicable to any type of distribution. In case of a non K. V. distribution, the comparison of these sets gives differential equations relating the rms emittances to correcting terms which depend on the charge distribution inside the beam. Such equations can be used to interpret some rms emittance increases observed either with a mismatch in a smooth focusing channel or with a matched beam in an AG focusing system.
OpenAlex reports 201 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The study of oscillations which can take place in a beam under space charge conditions has been extended to other distributions than the one described by Kapchinsky and Vladimirsky (K. V.) in 1959. Two sets of equations similar to the ones they established can be written provided axis and emittance values are replaced by rms expressions applicable to any type of distribution. In case of a non K. V. distribution, the comparison of these sets gives differential equations relating the rms emittances to correcting terms which depend on the charge distribution inside the beam. Such equations can be used to interpret some rms emittance increases observed either with a mismatch in a smooth focusing channel or with a matched beam in an AG focusing system.
Key concepts: Thermal emittance, Space charge, Beam emittance, Filamentation, Beam (structure), Physics, Space (punctuation), Distribution (mathematics)