Goos-Hänchen shift at the surface of the chiral negative refraction medium

Goos-Hanchen shift at the interface between normal material and the chiral negative refraction medium (its chirality parameter is greater than the refraction index) has been investigated. If the angle of incidence is between the two critical angles which correspond to left-handed circularly polarized wave and right-handed circularly polarized wave, different direction Goos-Hanchen lateral shifts of TE component and TM component in the reflected wave are experienced. These results are inversed with those in conventional chiral material and also different from those in the double negative materials.