2002Unpublished venueRequires access

Analysis of disturbed pattern statistical characteristics for apodized multi-element waveguide slot antennas

A.V. Kabanov, Vladimir Lukin

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Abstract

The statistical analysis of disturbed patterns for waveguide slot apodized multi-element antennas is performed. Both spatially independent and correlated phase errors with variances typical for practice are considered. The numerical simulation results are obtained for classical amplitude distributions and apodization functions earlier proposed by the authors. It is shown that the mean maximal side lobe level of disturbed patterns gradually increases in comparison to the potential level due to error influence. However, in the sense of statistical characteristics of the main lobe width and maximal side lobe level for disturbed patterns the proposed apodization functions provide appropriate results.

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What this paper is about

The statistical analysis of disturbed patterns for waveguide slot apodized multi-element antennas is performed. Both spatially independent and correlated phase errors with variances typical for practice are considered. The numerical simulation results are obtained for classical amplitude distributions and apodization functions earlier proposed by the authors. It is shown that the mean maximal side lobe level of disturbed patterns gradually increases in comparison to the potential level due to error influence. However, in the sense of statistical characteristics of the main lobe width and maximal side lobe level for disturbed patterns the proposed apodization functions provide appropriate results.

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Available abstract

The statistical analysis of disturbed patterns for waveguide slot apodized multi-element antennas is performed. Both spatially independent and correlated phase errors with variances typical for practice are considered. The numerical simulation results are obtained for classical amplitude distributions and apodization functions earlier proposed by the authors. It is shown that the mean maximal side lobe level of disturbed patterns gradually increases in comparison to the potential level due to error influence. However, in the sense of statistical characteristics of the main lobe width and maximal side lobe level for disturbed patterns the proposed apodization functions provide appropriate results.

Key concepts: Apodization, Side lobe, Main lobe, Amplitude, Phase (matter), Statistical analysis, Waveguide, Finite element method

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