1999•Journal of Electron MicroscopyRequires access

Influence of anti-symmetric wave aberrations and the simple correction filter in the Fourier space

Takashi Ikuta

Open publisher page 8 citations

Abstract

In imaging systems, especially in a high-resolution transmission electron microscope, residual aberrations of objective lenses, such as a spherical aberration or coma aberration, degrade the quality of observed images. Recently practical solutions by the use of an aberration-corrected lens or real-time image processing based on active defocus modulation have been reported with respect to the spherical aberration. Therefore, the future should be aimed at correcting other aberrations such as coma or higher-order astigmatisms. This paper describes the influence of such higher-order aberrations, and a preliminary attempt to correct the coma aberration for observed images under the coherent vertical illumination using an optical microscope. In addition, an estimation technique for the amplitude and the direction of the coma aberration using an image as is observed, is also discussed.

About this research paper

What this paper is about

In imaging systems, especially in a high-resolution transmission electron microscope, residual aberrations of objective lenses, such as a spherical aberration or coma aberration, degrade the quality of observed images. Recently practical solutions by the use of an aberration-corrected lens or real-time image processing based on active defocus modulation have been reported with respect to the spherical aberration. Therefore, the future should be aimed at correcting other aberrations such as coma or higher-order astigmatisms. This paper describes the influence of such higher-order aberrations, and a preliminary attempt to correct the coma aberration for observed images under the coherent vertical illumination using an optical microscope. In addition, an estimation technique for the amplitude and the direction of the coma aberration using an image as is observed, is also discussed.

Why it matters

OpenAlex reports 8 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

In imaging systems, especially in a high-resolution transmission electron microscope, residual aberrations of objective lenses, such as a spherical aberration or coma aberration, degrade the quality of observed images. Recently practical solutions by the use of an aberration-corrected lens or real-time image processing based on active defocus modulation have been reported with respect to the spherical aberration. Therefore, the future should be aimed at correcting other aberrations such as coma or higher-order astigmatisms. This paper describes the influence of such higher-order aberrations, and a preliminary attempt to correct the coma aberration for observed images under the coherent vertical illumination using an optical microscope. In addition, an estimation technique for the amplitude and the direction of the coma aberration using an image as is observed, is also discussed.

Key concepts: Coma (optics), Spherical aberration, Contrast transfer function, Optics, Lens (geology), Physics, Image quality, Optical aberration

Related papers

Back to paper searchBrowse research topicsOriginal source
Influence of anti-symmetric wave aberrations and the simple correction filter in the Fourier space — Research Paper | ScholarLens