Application of the simplified particle model theory to the diffuse reflectance properties of powdered layers
E.L. Simmons
Abstract
E.L. Simmons
Abstract
The simplified particle model theory of diffuse reflectance spectroscopy is used to relate the reflectance and transmittance of a powdered layer to the fundamental optical parameters. The resulting equations are compared with those obtained by the use of the Kubelka-Munk theory.
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The simplified particle model theory of diffuse reflectance spectroscopy is used to relate the reflectance and transmittance of a powdered layer to the fundamental optical parameters. The resulting equations are compared with those obtained by the use of the Kubelka-Munk theory.
Key concepts: Diffuse reflectance infrared fourier transform, Reflectivity, Transmittance, Diffuse reflection, Particle (ecology), Materials science, Optics, Spectroscopy