1976Journal of Applied PhysicsRequires access

Application of the simplified particle model theory to the diffuse reflectance properties of powdered layers

E.L. Simmons

Open publisher page 0 citations

Abstract

The simplified particle model theory of diffuse reflectance spectroscopy is used to relate the reflectance and transmittance of a powdered layer to the fundamental optical parameters. The resulting equations are compared with those obtained by the use of the Kubelka-Munk theory.

About this research paper

What this paper is about

The simplified particle model theory of diffuse reflectance spectroscopy is used to relate the reflectance and transmittance of a powdered layer to the fundamental optical parameters. The resulting equations are compared with those obtained by the use of the Kubelka-Munk theory.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The simplified particle model theory of diffuse reflectance spectroscopy is used to relate the reflectance and transmittance of a powdered layer to the fundamental optical parameters. The resulting equations are compared with those obtained by the use of the Kubelka-Munk theory.

Key concepts: Diffuse reflectance infrared fourier transform, Reflectivity, Transmittance, Diffuse reflection, Particle (ecology), Materials science, Optics, Spectroscopy

Related papers

Back to paper searchBrowse research topicsOriginal source
Application of the simplified particle model theory to the diffuse reflectance properties of powdered layers — Research Paper | ScholarLens