2005•IEEE Transactions on Applied SuperconductivityRequires access

NDE of Defects in Superconducting Wires Using SQUID Microscopy

Sang‐Yun Lee, V. Viswanathan, J. H. Huckans, J. Matthews, F. C. Wellstood

Abstract

Using a scanning Superconducting Quantum Interference Device (SQUID) microscope we have examined small samples of Nb-Ti wire with known defects and a sample with artificial defects. We orient the SQUID to measure the field parallel to the wire, which is near zero unless a defect is present. We also have examined known defects using a multi-channel scanning SQUID microscope. In addition, we have modified the nose cone of our SQUID microscope to enable fast NDE of long wires by positioning a thin tube immediately beneath the SQUID chip, while feeding the wire through the tube.

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Available abstract

Key concepts: Squid, Scanning SQUID microscopy, Microscope, Materials science, Superconductivity, Microscopy, Magnetic force microscope, Scanning probe microscopy