1993•MRS ProceedingsRequires access
Ab Initio XAFS and XANES Standards
J. J. Rehr, S. I. Zabinsky, R. C. Albers
Open publisher page 6 citations
Abstract
This record does not include an abstract. Use the full-text link above if available.
J. J. Rehr, S. I. Zabinsky, R. C. Albers
Abstract
An abstract is not available in the OpenAlex record for this paper.
OpenAlex reports 6 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Key concepts: XANES, X-ray absorption fine structure, Materials science, Ab initio, Absorption (acoustics), Scattering, Spectral line, Extended X-ray absorption fine structure