2010IEEE Transactions on Power DeliveryRequires access

Reliability Modeling of All-Digital Protection Systems Including Impact of Repair

Kai Jiang, Chanan Singh

Open publisher page 44 citations

Abstract

This paper explores the impact of including component repair on the reliability modeling of all-digital protection systems. It is shown that repairable and nonrepairable assumptions make a remarkable difference in the computed reliability indices of the mean time to failure (MTTF) and the mean time to first failure (MTTFF). Theoretical analysis of basic system structures consisting of two components is first examined. Then, a typical all-digital protection system architecture is modeled and numerically analyzed. Some interesting results are found by comparing reliability indices of MTTF and MTTFF and explanations of these results are provided.

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What this paper is about

This paper explores the impact of including component repair on the reliability modeling of all-digital protection systems. It is shown that repairable and nonrepairable assumptions make a remarkable difference in the computed reliability indices of the mean time to failure (MTTF) and the mean time to first failure (MTTFF). Theoretical analysis of basic system structures consisting of two components is first examined. Then, a typical all-digital protection system architecture is modeled and numerically analyzed. Some interesting results are found by comparing reliability indices of MTTF and MTTFF and explanations of these results are provided.

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OpenAlex reports 44 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This paper explores the impact of including component repair on the reliability modeling of all-digital protection systems. It is shown that repairable and nonrepairable assumptions make a remarkable difference in the computed reliability indices of the mean time to failure (MTTF) and the mean time to first failure (MTTFF). Theoretical analysis of basic system structures consisting of two components is first examined. Then, a typical all-digital protection system architecture is modeled and numerically analyzed. Some interesting results are found by comparing reliability indices of MTTF and MTTFF and explanations of these results are provided.

Key concepts: Mean time between failures, Reliability engineering, Reliability (semiconductor), Component (thermodynamics), Reliability theory, Maintenance engineering, Engineering, Computer science

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