Measurement of the FSR of a high finesse etalon with 2.5 kHz accuracy using a narrow-linewidth frequency swept laser
Dimitrios Mandridis, Marcus Bagnell, I. Ozdur, Peter J. Delfyett
Abstract
Dimitrios Mandridis, Marcus Bagnell, I. Ozdur, Peter J. Delfyett
Abstract
Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.
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Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.
Key concepts: Finesse, Fabry–Pérot interferometer, Laser linewidth, Citation, Laser, Computer science, Optoelectronics, Optics