2010Unpublished venueOpen access

Measurement of the FSR of a high finesse etalon with 2.5 kHz accuracy using a narrow-linewidth frequency swept laser

Dimitrios Mandridis, Marcus Bagnell, I. Ozdur, Peter J. Delfyett

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Abstract

Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.

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Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.

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Available abstract

Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrowlinewidth CW laser. © 2010 Optical Society of America.

Key concepts: Finesse, Fabry–Pérot interferometer, Laser linewidth, Citation, Laser, Computer science, Optoelectronics, Optics

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