2002Journal of Electron MicroscopyRequires access

Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (Part II)

C. Weissbacker, H. Rose

Open publisher page 21 citations

Abstract

A doubly symmetric electrostatic corrector which compensates for the axial chromatic and the axial third-order aberration of charged-particle lenses is outlined. Due to the double symmetry the corrector does not introduce linear off-axis aberrations and yields in combination with a round objective lens an electron-optical aplanat. The principle of the electrostatic correction of the axial chromatic aberration is explained in mathematical terms. The geometry of the electrodes of a suitable corrector is optimized with respect to the chromatic correction, the maximum strength of the electric field, and the residual higher-order aberrations which limit the resolution. The resulting aplanat achieves a resolution limit of about 2 nm for an image field with a diameter of 1500 nm. The required stabilities of the electric power supplies are discussed in detail.

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A doubly symmetric electrostatic corrector which compensates for the axial chromatic and the axial third-order aberration of charged-particle lenses is outlined. Due to the double symmetry the corrector does not introduce linear off-axis aberrations and yields in combination with a round objective lens an electron-optical aplanat. The principle of the electrostatic correction of the axial chromatic aberration is explained in mathematical terms. The geometry of the electrodes of a suitable corrector is optimized with respect to the chromatic correction, the maximum strength of the electric field, and the residual higher-order aberrations which limit the resolution. The resulting aplanat achieves a resolution limit of about 2 nm for an image field with a diameter of 1500 nm. The required stabilities of the electric power supplies are discussed in detail.

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Available abstract

A doubly symmetric electrostatic corrector which compensates for the axial chromatic and the axial third-order aberration of charged-particle lenses is outlined. Due to the double symmetry the corrector does not introduce linear off-axis aberrations and yields in combination with a round objective lens an electron-optical aplanat. The principle of the electrostatic correction of the axial chromatic aberration is explained in mathematical terms. The geometry of the electrodes of a suitable corrector is optimized with respect to the chromatic correction, the maximum strength of the electric field, and the residual higher-order aberrations which limit the resolution. The resulting aplanat achieves a resolution limit of about 2 nm for an image field with a diameter of 1500 nm. The required stabilities of the electric power supplies are discussed in detail.

Key concepts: Chromatic aberration, Spherical aberration, Electrostatic lens, Optics, Electric field, Physics, Electron optics, Lens (geology)

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Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (Part II) — Research Paper | ScholarLens