Extensions of design potential concept for reliability-based design optimization to nonsmooth and extreme cases
Kyung K. Choi, Jian Tu, Y.H. Park
Abstract
Kyung K. Choi, Jian Tu, Y.H. Park
Abstract
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Key concepts: Probabilistic design, Probabilistic logic, First-order reliability method, Engineering design process, Mathematical optimization, Reliability (semiconductor), Constraint (computer-aided design), Iterative design