Two Structure Types Based on Si6O15 Rings: Synthesis and Structural and Spectroscopic Characterisation of Cs1.86K1.14DySi6O15 and Cs1.6K1.4SmSi6O15
Maria Wierzbicka‐Wieczorek, Martin Göckeritz, Uwe Kolitsch, Christoph Lenz, Gerald Giester
Abstract
Maria Wierzbicka‐Wieczorek, Martin Göckeritz, Uwe Kolitsch, Christoph Lenz, Gerald Giester
Abstract
Abstract The silicate Cs1.86K1.14DySi6O15 represents a mixed tetrahedral‐octahedral framework structure type based on roughly circular Si6O15 rings and isolated DyO6 octahedra. The silicate Cs1.6K1.4SmSi6O15 has a layered atomic arrangement built from corrugated Si6O15 layers containing four‐, six‐ and eight‐membered rings. The layers are connected by isolated SmO6 octahedra to form a mixed tetrahedral‐octahedral framework. This structure shows a close structural relationship to β‐K3NdSi6O15 and a less close one to dehydrated elpidite (Na2ZrSi6O15). In both structures, Cs/K atoms occupy large voids. The silicates were obtained through high‐temperature flux syntheses. Their crystal structures have been determined from single‐crystal X‐ray diffraction data. Cs1.86K1.14DySi6O15 crystallises in R32 (no. 155) with a = 13.896(2), c = 35.623(7) Å and V = 5957.2(17) Å3, whereas Cs1.6K1.4SmSi6O15 crystallises in Cmca (no. 64) with a = 14.474(3), b = 14.718(3), c = 15.231(3) Å and V = 3244.7(11) Å3. The Dy3+ and Sm3+ cations present in the silicates cause PL emission bands in the visible yellow‐to‐orange spectral range.
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Abstract The silicate Cs1.86K1.14DySi6O15 represents a mixed tetrahedral‐octahedral framework structure type based on roughly circular Si6O15 rings and isolated DyO6 octahedra. The silicate Cs1.6K1.4SmSi6O15 has a layered atomic arrangement built from corrugated Si6O15 layers containing four‐, six‐ and eight‐membered rings. The layers are connected by isolated SmO6 octahedra to form a mixed tetrahedral‐octahedral framework. This structure shows a close structural relationship to β‐K3NdSi6O15 and a less close one to dehydrated elpidite (Na2ZrSi6O15). In both structures, Cs/K atoms occupy large voids. The silicates were obtained through high‐temperature flux syntheses. Their crystal structures have been determined from single‐crystal X‐ray diffraction data. Cs1.86K1.14DySi6O15 crystallises in R32 (no. 155) with a = 13.896(2), c = 35.623(7) Å and V = 5957.2(17) Å3, whereas Cs1.6K1.4SmSi6O15 crystallises in Cmca (no. 64) with a = 14.474(3), b = 14.718(3), c = 15.231(3) Å and V = 3244.7(11) Å3. The Dy3+ and Sm3+ cations present in the silicates cause PL emission bands in the visible yellow‐to‐orange spectral range.
Key concepts: Octahedron, Crystallography, Chemistry, Crystal structure, Silicate, X-ray crystallography, Tetrahedron, Diffraction