ScholarLens Back to search
2002•Unpublished venueRequires access

Aliasing-free signature analysis for RAM BIST

V. N. Yarmolik, M. Nicolaidis, O. Kebichi

Open publisher page 6 citations

Abstract

Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.

About this research paper

What this paper is about

Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.

Why it matters

OpenAlex reports 6 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.

Key concepts: Signature (topology), Aliasing, Built-in self-test, Computer science, Linear feedback shift register, Reduction (mathematics), Computer hardware, Embedded system

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
Aliasing-free signature analysis for RAM BIST — Research Paper | ScholarLens