2002Unpublished venueRequires access

An estimation method of the channel temperature of power MOS devices

Dominique Bergogne, Bruno Allard, Hervé Morel

Open publisher page 21 citations

Abstract

A method is presented to characterize the IGBT (insulated gate bipolar transistor) from a power module to obtain an internal temperature estimation. A prototype is described. The technique is compatible with operating PWM-based converters.

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What this paper is about

A method is presented to characterize the IGBT (insulated gate bipolar transistor) from a power module to obtain an internal temperature estimation. A prototype is described. The technique is compatible with operating PWM-based converters.

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OpenAlex reports 21 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

A method is presented to characterize the IGBT (insulated gate bipolar transistor) from a power module to obtain an internal temperature estimation. A prototype is described. The technique is compatible with operating PWM-based converters.

Key concepts: Insulated-gate bipolar transistor, Converters, Power semiconductor device, Current injection technique, Power (physics), Pulse-width modulation, Electronic engineering, Gate driver

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