Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software
Zhidong Qin, Hui Chen, Youqun Shi
Abstract
Zhidong Qin, Hui Chen, Youqun Shi
Abstract
In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.
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In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.
Key concepts: Reliability engineering, Computer science, Software reliability testing, Reliability (semiconductor), Software quality, Software performance testing, Duration (music), Software