High-isolation CPW MEMS shunt switches. 2. Design
Jeremy Muldavin, Gabriel M. Rebeiz
Abstract
Jeremy Muldavin, Gabriel M. Rebeiz
Abstract
For pt.1 see ibid., vol.48, no.6, p.1045-1052 (2000). In this paper, the second of two parts, the equivalent RLC model of the shunt switch is used in the design of tuned two- and four-bridge "cross" switches from 10 to 40 GHz. The cross switch attained an insertion loss of less than 0.3-0.6 dB, a return loss below -20 dB from 22 to 38 GHz in the up state, and a down-state isolation of 45-50 dB with only 1.5 pF of down-state capacitance (C/sub d/). Also, an X-band microelectromechanical system (MEMS) switch with an insertion loss of less than 0.2 dB and an isolation of 35 dB is presented. This is done by inductively tuning the LC series resonance of the shunt switch. The MEMS bridge height is 1.5-2.5 /spl mu/m, resulting in a pull-down voltage of 15-25 V. Application areas are in low-loss high-isolation communication and radar.
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For pt.1 see ibid., vol.48, no.6, p.1045-1052 (2000). In this paper, the second of two parts, the equivalent RLC model of the shunt switch is used in the design of tuned two- and four-bridge "cross" switches from 10 to 40 GHz. The cross switch attained an insertion loss of less than 0.3-0.6 dB, a return loss below -20 dB from 22 to 38 GHz in the up state, and a down-state isolation of 45-50 dB with only 1.5 pF of down-state capacitance (C/sub d/). Also, an X-band microelectromechanical system (MEMS) switch with an insertion loss of less than 0.2 dB and an isolation of 35 dB is presented. This is done by inductively tuning the LC series resonance of the shunt switch. The MEMS bridge height is 1.5-2.5 /spl mu/m, resulting in a pull-down voltage of 15-25 V. Application areas are in low-loss high-isolation communication and radar.
Key concepts: Insertion loss, Return loss, Shunt (medical), Microelectromechanical systems, Capacitance, Electrical engineering, Materials science, Optoelectronics