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A comparison of gettering in single- and multicrystalline silicon for solar cells

Bhushan Sopori, L. Jastrzȩbski, T. Y. Tan

Open publisher page 30 citations

Abstract

The differences in the impurity gettering between single and multicrystalline silicon are discussed. These differences arise from impurity-defect interactions that occur during thermal processing of multicrystalline material. A gettering model is proposed to explain the observed behaviour of gettering in multicrystalline cells.

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What this paper is about

The differences in the impurity gettering between single and multicrystalline silicon are discussed. These differences arise from impurity-defect interactions that occur during thermal processing of multicrystalline material. A gettering model is proposed to explain the observed behaviour of gettering in multicrystalline cells.

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Available abstract

The differences in the impurity gettering between single and multicrystalline silicon are discussed. These differences arise from impurity-defect interactions that occur during thermal processing of multicrystalline material. A gettering model is proposed to explain the observed behaviour of gettering in multicrystalline cells.

Key concepts: Getter, Silicon, Materials science, Impurity, Thermal, Optoelectronics, Metallurgy, Chemistry

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