2003Unpublished venueRequires access

Redundancy identification and removal in combinational logic circuits

T.-C. Lee, Niraj K. Jha

Open publisher page 2 citations

Abstract

The authors present an efficient RI and RR (redundancy identification and removal) method for combinational logic circuits, called RIDAR, which can perform RI by taking advantage of the functional specification and can remove simultaneously more than one redundancy during one RR iteration. Experimental results show that significant savings in literal-count can be obtained for synthesized circuits in small amounts of CPU time. Surprisingly, it is found that a significant reduction in literal-count can be obtained in many cases for combinational circuits even when conventional ATPG (automatic test pattern generation) declares the circuit to be irredundant.>

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What this paper is about

The authors present an efficient RI and RR (redundancy identification and removal) method for combinational logic circuits, called RIDAR, which can perform RI by taking advantage of the functional specification and can remove simultaneously more than one redundancy during one RR iteration. Experimental results show that significant savings in literal-count can be obtained for synthesized circuits in small amounts of CPU time. Surprisingly, it is found that a significant reduction in literal-count can be obtained in many cases for combinational circuits even when conventional ATPG (automatic test pattern generation) declares the circuit to be irredundant.>

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Available abstract

The authors present an efficient RI and RR (redundancy identification and removal) method for combinational logic circuits, called RIDAR, which can perform RI by taking advantage of the functional specification and can remove simultaneously more than one redundancy during one RR iteration. Experimental results show that significant savings in literal-count can be obtained for synthesized circuits in small amounts of CPU time. Surprisingly, it is found that a significant reduction in literal-count can be obtained in many cases for combinational circuits even when conventional ATPG (automatic test pattern generation) declares the circuit to be irredundant.>

Key concepts: Combinational logic, Redundancy (engineering), Literal (mathematical logic), Computer science, Automatic test pattern generation, Sequential logic, Electronic circuit, Algorithm

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