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Speckle interferometry in transparent media

Dean D. Verhoeven, Patrick V. Farrell

Abstract

Speckle interferometry is applied to transparent media to obtain measurements of full-field density variations. Speckle interferometry can present decreased vibration sensitivity compared to some wave front comparison methods while maintaining high sensitivity. Speckle interferometry also has some advantages over speckle photography for certain geometries. Temperatures calculated from speckle interferometry measurements are compared with thermocouple measurements for a cylindrical flame.

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Available abstract

Key concepts: Electronic speckle pattern interferometry, Speckle pattern, Speckle imaging, Optics, Interferometry, Speckle noise, Materials science, Sensitivity (control systems)