Hard-X-ray dark-field imaging using a grating interferometer
Franz Pfeiffer, Martin Bech, Oliver Bunk, Philipp Kraft, Eric F. Eikenberry, Ch. Brönnimann, C. Grünzweig, Christophe David
Abstract
Franz Pfeiffer, Martin Bech, Oliver Bunk, Philipp Kraft, Eric F. Eikenberry, Ch. Brönnimann, C. Grünzweig, Christophe David
Abstract
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Key concepts: Optics, X-Ray Phase-Contrast Imaging, Dark field microscopy, Phase-contrast imaging, Materials science, Grating, Scattering, Contrast (vision)