Multiport scattering matrix measurement using a reduced-port network analyzer
Hsin‐Chia Lu, Tah-Hsiung Chu
Abstract
Hsin‐Chia Lu, Tah-Hsiung Chu
Abstract
A novel method for acquiring the scattering matrix of an n-port network from measurements using a reduced-port network analyzer is developed. This method can obtain the scattering matrix of a nonreciprocal or reciprocal n-port network with the use of a three- or two-port network analyzer. The formulation of this method considers the imperfection of terminators used in the measurement, and only two of the terminators are required to be known. Experimental results from a four-port microstrip circuit show good accuracy using the developed method.
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A novel method for acquiring the scattering matrix of an n-port network from measurements using a reduced-port network analyzer is developed. This method can obtain the scattering matrix of a nonreciprocal or reciprocal n-port network with the use of a three- or two-port network analyzer. The formulation of this method considers the imperfection of terminators used in the measurement, and only two of the terminators are required to be known. Experimental results from a four-port microstrip circuit show good accuracy using the developed method.
Key concepts: Network analyzer (electrical), Scattering parameters, S-matrix theory, Port (circuit theory), Scattering, Matrix (chemical analysis), Microstrip, Electronic engineering