Focused ion beam (FIB)/scanning electron microscopy (SEM) in tissue structural research
Vladka Lešer, Marziale Milani, Francesco Tatti, Živa Pipan Tkalec, Jasna Štrus, Damjana Drobne
Abstract
Vladka Lešer, Marziale Milani, Francesco Tatti, Živa Pipan Tkalec, Jasna Štrus, Damjana Drobne
Abstract
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Key concepts: Focused ion beam, Scanning electron microscope, Materials science, Transmission electron microscopy, Electron beam-induced deposition, Secondary electrons, Nanotechnology, Electron microscope