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An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers

S. Venkataraman, Janusz Rajski, Sybille Hellebrand, Steffen Tarnick

Open publisher page 103 citations

Abstract

In this paper we describe an optimized BIST scheme based on reseeding of multiple polynomial Linear Feedback Shift Registers (LFSRs). The same LFSR that is used to generate pseudo-random patterns, is loaded with seeds from which it produces vectors that cover the testcubes of difficult to test faults. The scheme is compatible with scandesign and achieves full coverage as it is based on random patterns combined with a deterministic test set.

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What this paper is about

In this paper we describe an optimized BIST scheme based on reseeding of multiple polynomial Linear Feedback Shift Registers (LFSRs). The same LFSR that is used to generate pseudo-random patterns, is loaded with seeds from which it produces vectors that cover the testcubes of difficult to test faults. The scheme is compatible with scandesign and achieves full coverage as it is based on random patterns combined with a deterministic test set.

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OpenAlex reports 103 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

In this paper we describe an optimized BIST scheme based on reseeding of multiple polynomial Linear Feedback Shift Registers (LFSRs). The same LFSR that is used to generate pseudo-random patterns, is loaded with seeds from which it produces vectors that cover the testcubes of difficult to test faults. The scheme is compatible with scandesign and achieves full coverage as it is based on random patterns combined with a deterministic test set.

Key concepts: Scheme (mathematics), Shift register, Linear feedback shift register, Computer science, Polynomial, Built-in self-test, Time complexity, Mathematics

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