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광통신용 1.25Gbps Transceiver 가속수명시험
윤광수, 유정희, 허영순
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Abstract
In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions