ScholarLens Back to search
1998•High Temperature Materials and ProcessesOpen access

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy

K. Hono, Mitsuhiro Murayama

Open full text 2 citations

Abstract

Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed.By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe.Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscale characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

Open-access reader

About this research paper

What this paper is about

Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed.By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe.Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscale characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

Why it matters

OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed.By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe.Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscale characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

Key concepts: Atom probe, Field ion microscope, Materials science, Nanocrystalline material, Nanoscopic scale, Microscopy, Nanotechnology, Scanning probe microscopy

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy — Research Paper | ScholarLens