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2006•Unpublished venueRequires access

Segmented Foil SEM Profile Monitors for High Intensity Proton Beams at Fermilab

S. Köpp, B. Baller, S. Childress, R. Ford, Deborah A. Harris, D. Indurthy, C. Kendziora, C. D. Moore, Ž. Pavlović, M. Proga, G. Tassotto, R. Zwaska

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Abstract

We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5 /spl mu/m thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.

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What this paper is about

We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5 /spl mu/m thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.

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Available abstract

We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5 /spl mu/m thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.

Key concepts: Fermilab, Beam (structure), FOIL method, Proton, Materials science, Intensity (physics), Centroid, Optics

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Segmented Foil SEM Profile Monitors for High Intensity Proton Beams at Fermilab — Research Paper | ScholarLens