2003Optics ExpressOpen access

Two-point-separation in super-resolution fluorescence microscope based on up-conversion fluorescence depletion technique

Takeshi Watanabe, Yoshinori Iketaki, Takashige Omatsu, Kimihisa Yamamoto, Makoto Sakai, Masaaki Fujii

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Abstract

Pronounced separation (750 nm) between two individual fluorescence spots in a novel super-resolution microscopy based on a two-color up-conversion fluorescence depletion technique has been investigated. This microscopy has the potential to achieve a spatial resolution (<300nm) of 1/2 the diffraction limit.

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What this paper is about

Pronounced separation (750 nm) between two individual fluorescence spots in a novel super-resolution microscopy based on a two-color up-conversion fluorescence depletion technique has been investigated. This microscopy has the potential to achieve a spatial resolution (<300nm) of 1/2 the diffraction limit.

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Available abstract

Pronounced separation (750 nm) between two individual fluorescence spots in a novel super-resolution microscopy based on a two-color up-conversion fluorescence depletion technique has been investigated. This microscopy has the potential to achieve a spatial resolution (<300nm) of 1/2 the diffraction limit.

Key concepts: Optics, Fluorescence microscope, Microscopy, Fluorescence, Materials science, Resolution (logic), Light sheet fluorescence microscopy, Photoactivated localization microscopy

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