2003•Materials Science and Engineering BRequires access

Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function

Thilo Glatzel, Sascha Sadewasser, Rafi Shikler, Y. Rosenwaks, Martha Ch. Lux‐Steiner

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Key concepts: Kelvin probe force microscope, Surface photovoltage, Work function, Volta potential, Semiconductor, Homojunction, Band bending, Microscopy

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Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function — Research Paper | ScholarLens