Integrated reliability and prognostics prediction methodology for power electronic modules
C. Bailey, Hua Lu, Chunyan Yin, Timothy Tilford
Abstract
C. Bailey, Hua Lu, Chunyan Yin, Timothy Tilford
Abstract
The article consists of a PowerPoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.
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The article consists of a PowerPoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.
Key concepts: Prognostics, Reliability (semiconductor), Reliability engineering, Power electronics, Insulated-gate bipolar transistor, Power (physics), Electronics, Physics of failure