2008•Unpublished venueRequires access

Integrated reliability and prognostics prediction methodology for power electronic modules

C. Bailey, Hua Lu, Chunyan Yin, Timothy Tilford

Open publisher page 3 citations

Abstract

The article consists of a PowerPoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.

About this research paper

What this paper is about

The article consists of a PowerPoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.

Why it matters

OpenAlex reports 3 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

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Method / approach

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Available abstract

The article consists of a PowerPoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.

Key concepts: Prognostics, Reliability (semiconductor), Reliability engineering, Power electronics, Insulated-gate bipolar transistor, Power (physics), Electronics, Physics of failure

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