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Enhanced effects with scanning force microscopy

S. Howells, T. Chen, M. J. Gallagher, L. Yi, Dror Sarid

Open publisher page 6 citations

Abstract

We present a general theory that describes the operation of scanning force microscopy in the contact force regime. We find that force derivatives along the surface of a sample produce images that can be dramatically enhanced relative to those of surface topography. For scanning tunneling microscopy atomic force microscopy (STM/AFM) and AFM configurations, the spring constant of the cantilever and the force derivatives perpendicular to the surface of the sample determine the enhancement, respectively.

About this research paper

What this paper is about

We present a general theory that describes the operation of scanning force microscopy in the contact force regime. We find that force derivatives along the surface of a sample produce images that can be dramatically enhanced relative to those of surface topography. For scanning tunneling microscopy atomic force microscopy (STM/AFM) and AFM configurations, the spring constant of the cantilever and the force derivatives perpendicular to the surface of the sample determine the enhancement, respectively.

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OpenAlex reports 6 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

We present a general theory that describes the operation of scanning force microscopy in the contact force regime. We find that force derivatives along the surface of a sample produce images that can be dramatically enhanced relative to those of surface topography. For scanning tunneling microscopy atomic force microscopy (STM/AFM) and AFM configurations, the spring constant of the cantilever and the force derivatives perpendicular to the surface of the sample determine the enhancement, respectively.

Key concepts: Cantilever, Scanning Force Microscopy, Non-contact atomic force microscopy, Conductive atomic force microscopy, Scanning tunneling microscope, Microscopy, Atomic force microscopy, Perpendicular

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