2001•Japanese Journal of Applied PhysicsOpen access
Visibility Measurement with an X-Ray Interferometer Using a Coincidence Technique
Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa
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Abstract
A coincidence measurement was combined with conventional interferometry in the X-ray region. It was theoretically and experimentally shown that the coincidence counting rate between two output ports of an X-ray interferometer is directly related to the visibilities of the interference beams. The method developed here will be a powerful tool in constructing more general X-ray interferometers.
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