1992•Microelectronics ReliabilityRequires access

A comparison of classical and Bayes risks when the quality varies randomly

K.K. Sharma, R.K. Bhutani

Open publisher page 10 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

OpenAlex reports 10 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Acceptance sampling, Bayes' theorem, Statistics, Sampling (signal processing), Quality (philosophy), Plan (archaeology), Computer science, Bayes factor

Back to paper search Browse research topics Original source

A comparison of classical and Bayes risks when the quality varies randomly — Research Paper | ScholarLens