2014•Advances in intelligent systems and computingRequires access

Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram

Guochang Zhou, Baolong Guo, Xiang Gao, Dan Zhao, Yunyi Yan

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Key concepts: Reliability block diagram, Reliability (semiconductor), Reliability engineering, Block diagram, Computer science, Markov process, Markov chain, Markov model

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Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram — Research Paper | ScholarLens