1980Applied Physics LettersRequires access

An improved anodic oxide insulator for InP metal-insulated-semiconductor field-effect transistors

D.H. Laughlin, C. W. Wilmsen

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Abstract

Highly insulation oxide layers have been anodically grown on InP. The oxide was grown in an electrolyte of pH<2.5 which causes In203 to dissolve out of the growing oxide layer, resulting in a P2O5/In2O3 ratio larger than one. The increase in oxide resistivity is attributed to the high concentration of P2O5 in the layers, since the P2O5 has a large band gap.

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What this paper is about

Highly insulation oxide layers have been anodically grown on InP. The oxide was grown in an electrolyte of pH<2.5 which causes In203 to dissolve out of the growing oxide layer, resulting in a P2O5/In2O3 ratio larger than one. The increase in oxide resistivity is attributed to the high concentration of P2O5 in the layers, since the P2O5 has a large band gap.

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Available abstract

Highly insulation oxide layers have been anodically grown on InP. The oxide was grown in an electrolyte of pH<2.5 which causes In203 to dissolve out of the growing oxide layer, resulting in a P2O5/In2O3 ratio larger than one. The increase in oxide resistivity is attributed to the high concentration of P2O5 in the layers, since the P2O5 has a large band gap.

Key concepts: Oxide, Materials science, Electrolyte, Insulator (electricity), Metal, Optoelectronics, Semiconductor, Field-effect transistor

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