An improved anodic oxide insulator for InP metal-insulated-semiconductor field-effect transistors
D.H. Laughlin, C. W. Wilmsen
Abstract
D.H. Laughlin, C. W. Wilmsen
Abstract
Highly insulation oxide layers have been anodically grown on InP. The oxide was grown in an electrolyte of pH<2.5 which causes In203 to dissolve out of the growing oxide layer, resulting in a P2O5/In2O3 ratio larger than one. The increase in oxide resistivity is attributed to the high concentration of P2O5 in the layers, since the P2O5 has a large band gap.
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Highly insulation oxide layers have been anodically grown on InP. The oxide was grown in an electrolyte of pH<2.5 which causes In203 to dissolve out of the growing oxide layer, resulting in a P2O5/In2O3 ratio larger than one. The increase in oxide resistivity is attributed to the high concentration of P2O5 in the layers, since the P2O5 has a large band gap.
Key concepts: Oxide, Materials science, Electrolyte, Insulator (electricity), Metal, Optoelectronics, Semiconductor, Field-effect transistor