1991Quality and Reliability Engineering InternationalRequires access

New methods for specification and determination of component reliability characteristics

Jørgen Møltoft

Open publisher page 8 citations

Abstract

Abstract In the last two decades it has become clear that component lifetime distributions are seldom exponential. Early failures due to flaws have been of major concern. Various models to cater for this observation have been suggested. The models have been developed from a component rather from a system point of view. Furthermore, no substitute for the heavily criticized MIL‐HDBK‐217‐type prediction handbooks has been offered. This paper describes a recently developed methodology to arrive at realistic component reliability characteristics, which take into account the non‐exponential component lifetime distributions. These characteristics are developed from a system's point of view, which makes it easier for the system manufacturer to assess the reliability of their systems in the field. The methodology is based on six years of research in field performance of electronic systems. The research has been carried out in close co‐operation with industrial companies.

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Abstract In the last two decades it has become clear that component lifetime distributions are seldom exponential. Early failures due to flaws have been of major concern. Various models to cater for this observation have been suggested. The models have been developed from a component rather from a system point of view. Furthermore, no substitute for the heavily criticized MIL‐HDBK‐217‐type prediction handbooks has been offered. This paper describes a recently developed methodology to arrive at realistic component reliability characteristics, which take into account the non‐exponential component lifetime distributions. These characteristics are developed from a system's point of view, which makes it easier for the system manufacturer to assess the reliability of their systems in the field. The methodology is based on six years of research in field performance of electronic systems. The research has been carried out in close co‐operation with industrial companies.

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Available abstract

Abstract In the last two decades it has become clear that component lifetime distributions are seldom exponential. Early failures due to flaws have been of major concern. Various models to cater for this observation have been suggested. The models have been developed from a component rather from a system point of view. Furthermore, no substitute for the heavily criticized MIL‐HDBK‐217‐type prediction handbooks has been offered. This paper describes a recently developed methodology to arrive at realistic component reliability characteristics, which take into account the non‐exponential component lifetime distributions. These characteristics are developed from a system's point of view, which makes it easier for the system manufacturer to assess the reliability of their systems in the field. The methodology is based on six years of research in field performance of electronic systems. The research has been carried out in close co‐operation with industrial companies.

Key concepts: Component (thermodynamics), Reliability engineering, Reliability (semiconductor), Field (mathematics), Point (geometry), Computer science, Exponential distribution, Physics of failure

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