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1987•Journal of Applied PhysicsOpen access

Observation of magnetic forces by the atomic force microscope

Juan José Sáenz, Nicolás García, Peter Grütter, Ernst Meyer, H. Heinzelmann, R. Wiesendanger, L. Rosenthaler, H.‐R. Hidber, H.‐J. Güntherodt

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Abstract

We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample surface magnetic domains. The influence of the experimental conditions on the performance of the AFM as a magnetic profiling device is also discussed. Preliminary experimental results are reported.

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What this paper is about

We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample surface magnetic domains. The influence of the experimental conditions on the performance of the AFM as a magnetic profiling device is also discussed. Preliminary experimental results are reported.

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Available abstract

We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample surface magnetic domains. The influence of the experimental conditions on the performance of the AFM as a magnetic profiling device is also discussed. Preliminary experimental results are reported.

Key concepts: Magnetic force microscope, Magnetic domain, Atomic force microscopy, Magnetic resonance force microscopy, Materials science, Microscope, Conductive atomic force microscopy, Single domain

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