ScholarLens Back to search
1972•Journal of Applied PhysicsRequires access

Electron Microprobe Analysis of Ion-Implanted CdS

P. K. Govind, F.J. Fraikor

Open publisher page 2 citations

Abstract

An electron beam microprobe was utilized to study the depth distribution of ion-implanted bismuth in CdS. The results, shown as a plot of relative Bi concentration vs depth, indicate that the bismuth concentration profile is of the type exp(−x/λ). Furthermore, the microprobe data reveal substantially deeper ion penetrations than predicted by LSS range theory.

About this research paper

What this paper is about

An electron beam microprobe was utilized to study the depth distribution of ion-implanted bismuth in CdS. The results, shown as a plot of relative Bi concentration vs depth, indicate that the bismuth concentration profile is of the type exp(−x/λ). Furthermore, the microprobe data reveal substantially deeper ion penetrations than predicted by LSS range theory.

Why it matters

OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

An electron beam microprobe was utilized to study the depth distribution of ion-implanted bismuth in CdS. The results, shown as a plot of relative Bi concentration vs depth, indicate that the bismuth concentration profile is of the type exp(−x/λ). Furthermore, the microprobe data reveal substantially deeper ion penetrations than predicted by LSS range theory.

Key concepts: Microprobe, Bismuth, Electron microprobe, Ion, Ion implantation, Materials science, Analytical Chemistry (journal), Range (aeronautics)

Related papers

Related paper 1Related paper 2
Back to paper searchBrowse research topicsOriginal source
Electron Microprobe Analysis of Ion-Implanted CdS — Research Paper | ScholarLens