1992•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access
High-resolution XUV spectroscopy of x-ray laser plasmas
Jeffrey A. Koch, Phillip J. Batson, Michael R. Carter, Karen L. Chapman, Luíz Bueno da Silva, B. J. MacGowan, Dennis L. Matthews, Stanley Mrowka, J. H. Scofield, G. Shimkaveg, J. H. Underwood, Rosemary S. Walling
Open publisher page 3 citations
Abstract
This paper discusses recent progress in LLNL's high resolution XUV spectroscopy efforts with x-ray laser plasmas. We describe the instrumentation used, and we present preliminary time-resolved data on the spectral profiles of several XUV (extreme ultraviolet) lines from Ne- like Se and Ne-like Y x-ray lasers which have been obtained with instrumental resolutions ((lambda) /(Delta) (lambda) ) of approximately 10,000. The Se data indicates that the 206.4 angstroms J equals 2 - 1 laser line narrows below the expected 400 eV Doppler width (35 m angstroms) when amplified through approximately 6 gain lengths, while the Y data shows no evidence of the J equals 0 - 1 laser predicted to be nearly resonant with the J equals 2 - 1 laser at 154.9 angstroms.