1993•NDT & E InternationalRequires access
NDT reliability and product quality
Jossy van den Boogaard, Gerda M. van Dijk
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Abstract
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Jossy van den Boogaard, Gerda M. van Dijk
Abstract
An abstract is not available in the OpenAlex record for this paper.
OpenAlex reports 4 citations for this work. Citation counts describe recorded attention and do not establish research quality.
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Key concepts: Nondestructive testing, Reliability engineering, Reliability (semiconductor), Quality (philosophy), Product (mathematics), Engineering, Computer science, Forensic engineering