ScholarLens Back to search
1996•Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and AtomsRequires access

Laterally resolved crystalline damage in single-point-diamond-turned silicon

Chris Jeynes, Keith E. Puttick, Lawrence Whitmore, K. Gärtner, Anthony E. Gee, D.K. Millen, Roger P Webb, R.M.A. Peel, Brian J. Sealy

Open publisher page 27 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

OpenAlex reports 27 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Channelling, Microbeam, Diamond, Materials science, Silicon, Transmission electron microscopy, Amorphous solid, Layer (electronics)

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
Laterally resolved crystalline damage in single-point-diamond-turned silicon — Research Paper | ScholarLens