2006•Applied Surface ScienceRequires access

Electron scattering mechanisms in indium–tin-oxide thin films prepared at the various process conditions

Ho-Chul Lee

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Key concepts: Diffractometer, Electron mobility, Ionized impurity scattering, Carrier scattering, Thin film, Materials science, Analytical Chemistry (journal), Indium tin oxide

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Electron scattering mechanisms in indium–tin-oxide thin films prepared at the various process conditions — Research Paper | ScholarLens