2003•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIEOpen access

Scanning total internal reflection fluorescence microscopy

Miṅ Gu, James W. M. Chon

Abstract

We report on a new form of total internal reflection fluorescence microscopy. Instead of using a prism, an objective of numerical aperture 1.65 is used under ring beam illumination. As a result, the propagating component of the illumination wave is suppressed and a focused evanescent spot is produced with strength of 20 times stronger than that in the prism. A near-field image is obtained by the scanning of a sample illuminated by the evanescent focal spot. The new imaging system has been successfully used for characterizing CdSe quantum dot nanoparticles and will be useful in nano-fabrication and single-molecular detection.

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Key concepts: Optics, Total internal reflection fluorescence microscope, Prism, Total internal reflection, Microscopy, Materials science, Numerical aperture, Reflection (computer programming)