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Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Ch. Sommerhalter, Thilo Glatzel, Th.W Matthes, Arnulf Jäger‐Waldau, Martha Ch. Lux‐Steiner

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Key concepts: Volta potential, Kelvin probe force microscope, Electrostatic force microscope, Amplitude, Non-contact atomic force microscopy, Cantilever, Voltage, Materials science

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Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces — Research Paper | ScholarLens